Patrick Flynn

Patrick Flynn

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Duda Family Professor of Engineering, Professor of Computer Science and Engineering

Office: 323B Cushing Hall
Phone: 574-631-8803

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Areas of Expertise

Biometrics, computer vision, image processing, mobile app development

Flynn pursues research in the general area of computer vision. Along with colleague Kevin Bowyer, Flynn has been researching the feasibility of image-based biometrics and multi-biometrics since 2001, including first-of-kind comparisons of face photographs, face thermograms, 3-D face images, iris images, videos of human gait, and even ear and hand shapes. The effort has enabled Flynn and Bowyer to assemble the largest database of multi-modal biometrics in the world. Since the terrorist attacks of Sept. 11, 2001, federal agencies have frequently used Flynn and Bowyer’s research and expertise to obtain objective analysis of commercial biometrics technologies.


Biometrics Research


Notre Dame receives Grand Challenges Explorations grant for research in global health and development
Kevin Bowyer to receive IEEE Computer Society Technical Achievement Award
Notre Dame mobile concussion app research to be funded by NFL/GE Head Health Challenge
McCloskey Business Plan Competition announces winners
Paper-based counterfeit drug testing gains attention
Engineering professor named IEEE fellow
Notre Dame computer vision experts develop questionable observer detector
Students’ mood chart application hits the App Store
Twins are intriguing subjects for Notre Dame biometrics researchers
Biometrics researchers coauthor report on facial recognition technology
Computer science and engineering professor named fellow of society


National Geographic — Twins
Science Watch — Patrick J. Flynn Interview: Special Topic of Face Recognition